Cadmium Oxide films have been prepared by vacuum evaporation technique on a
glass substrate at room temperature. Structural optical and morphological properties of
the films are studied at different oxidation temperatures (573 To 773) K, for the
thickness (300) nm at 30 mint. XRD pattern confirm the films shows the
polycrystalline nature of the film with preferential orientation along (111) plane. The
film deposited with higher oxidation temperatures shows higher transmittance
compared to others. Direct energy band gap of CdO thin film increases with increases
of oxidation temperature. From AFM measurement, the average grain size is in the
range of nanometer and it shows the faceted columnar microstructure of the film is
perpendicular to the surface.
Keywords: Thermal Evaporation, Cdo Thin Films, Thin Films.
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